牛津仪器Cypher ES Polymer Ed 原子力显微镜

Cypher ES Polymer Ed是专门为聚合物材料的研究量身定做。它拥有与Cypher ES一样的出色性能和多功能性,同时还配置了:blueDrive 光热激发轻敲模式、来自NanoMechPro工具箱的三大技术(用于纳米机械表征),以及高温聚合物加热器。

容易实现的原子力级高分辨成像

可实现快速扫描,扫描时间以秒计,而非分钟

操作的每一步都简单、方便,效率高

实验室占用空间小,研发能力提升潜力大

可通过密闭的腔室进行气体和液体灌注

可将样本温度控制在0-250°C的范围内

具有与刺激性化学品的广泛相容性

牛津仪器Cypher ES Polymer Ed 原子力显微镜优势和特点

相比其他,通常能够获得更高的分辨率

Unmatched mechanical stability—noise floor half  that of any other AFM

Exceptionally low drift—higher resolution and straight lattice lines

Low noise electronics—no artifacts from electronic noise sources

可实现快速扫描,扫描时间以秒计,而非分钟

Scans 10-100× faster than typical AFMs

Supports the fastest, smallest probes (3×9 μm spot size—optional)

Fast scanning that goes beyond topography—also nanomechanics, CAFM, PFM

操作的每一步都简单、方便,效率高

ModeMaster™ automatically configures software for selected mode

SpotOn™ makes the fully motorized laser and detector alignment one-click

GetReal™ automatically calibrates the cantilever spring constant and sensitivity

GetStarted™ automatically sets optimal parameters for tapping mode imaging

blueDrive™ makes tapping mode simpler, more stable, and more quantitative

实验室占用空间小,研发能力提升潜力巨大

Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)

Unmatched range of nanoelectrical and electromechanical characterization modes

Upgradeable to the Cypher VRS for video-rate imaging

Many standard operating modes and even more optional modes

提供超出您预期的售后支持和服务

Includes a standard two-year comprehensive warranty

No-charge technical support and expert applications support for life

Extended warranty and repair costs are the lowest in the industry

可通过密闭的腔室进行气体和液体灌注

Fully sealed sample cells maintain a controlled environment and eliminate the risk of leaks

Compatible with fast scanning and all environmental control accessories

可将样本温度控制在0-250°C的范围内

Optional Heater-Cooler extends the sample range to 0–120°C

-drift lets you keep imaging while ramping the

Quick and easy to setup and use, no external controllers, tubing, wires, etc.

具有与刺激性化学品的广泛相容性

Sample cells are constructed so that only fused silica and the clip (PEEK or stainless steel) are in contact with liquid

Optional glovebox configuration allows use with oxygen or water sensitive materials

牛津仪器Cypher ES Polymer Ed 原子力显微镜操作模式

包括以下操作模式

Contact mode

DART PFM

Dual AC

Dual AC Resonance Tracking (DART)

Electrostatic Force Microscopy (EFM)

Force curves

Force Mapping Mode (force volume)

Force modulation

modulation

Kelvin Force Microscopy (KPFM)

Lateral Force Mode (LFM)

Loss tangent imaging

Force Microscopy ()

Nanolithography

Nanomanipulation

imaging

Piezoresponse Force Microscopy (PFM)

Switching PFM

Tapping mode (AC mode)

Tapping mode with digital Q control

Vector PFM

Included in the Polymer Edition Package

AM-FM Viscoelastic Mapping Mode

Contact Resonance Viscoelastic Mapping Mode

Fast Force Mapping Mode

可选操作模式

Conductive (CAFM) with ORCA™ and Eclipse™ Mode

Current mapping with Fast Force Mapping

Electrochemical Strain Microscopy (ESM)

voltage PFM

Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

Scanning Impedance Microscopy (sMIM)

Scanning Tunneling Microscopy ()

Note: sMIM requires the Cypher S scanner.