MFP-3D Origin™ 具有Asylum Research产品的稳定性能和高品质。 Origin系列既有稳定的性能,又有实惠的价格。它可以实现高分辨率成像,并支持大尺寸样本、多种成像模式,以及多种配件。因此,Origin系列是一款理想的AFM入门产品! 高品质的科研级AFM 性能稳定:三轴分离设计的扫描器,从原子分辨率扫描至超大的120 μm扫描范围 易于使用、坚固耐用,适合繁忙的实验室 支持多种模式和配件,帮助您获得形貌以外更多的样品信息 易于升级,可通过升级获得新功能 提供专业的售后支持和服务 牛津仪器MFP-3D Origin™ 原子力显微镜特点和优势 高品质的科研级AFM -resolution imaging in both air and fluid — 120 μm XY range and 15 μm Z (40 μm optional) Accurate, lowest-noise force measurements Modern flexured and sensored scanner makes the easier to use and improves measurement accuracy Large sample stage makes navigation easy Engage and scan—quickly, easily and reliably 易于使用、坚固耐用,适合繁忙的实验室 SmartStart™ automatically detects and configures system components to get results quickly ModeMaster™ automatically configures software for selected mode GetReal™ automatically calibrates the cantilever spring constant and sensitivity GetStarted™ automatically sets optimal parameters for tapping mode imaging 支持多种模式和配件,帮助您获得形貌以外更多的样品信息 Nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus) Large range of nanoelectrical and electromechanical characterization modes control for heating samples to 275°C Controlled gas or liquid environment options that are simple, safe and effective 专业的支持和售后服务 Includes a one-year comprehensive warranty No-charge technical support and expert applications support for life Extended warranty and repair costs are the lowest in the industry Easy upgrade path to the MFP-3D Origin+ or MFP-3D Infinity 牛津仪器MFP-3D Origin™ 原子力显微镜操作模式 包括以下操作模式 Contact mode DART PFM Dual AC™ Dual AC Resonance Tracking (DART) Electrostatic Force Microscopy (EFM) Force curves Force Mapping Mode (force volume) Force modulation modulation Kelvin Force Microscopy (KPFM) Lateral Force Mode (LFM) Loss tangent imaging Force Microscopy () Nanolithography Nanomanipulation imaging Piezoresponse Force Microscopy (PFM) Switching PFM Tapping mode (AC mode) Tapping mode with digital Q control Vector PFM 可选操作模式 AM-FM Viscoelastic Mapping Mode Conductive (CAFM) with ORCA™ and Eclipse™ Mode iDrive™ (magnetically actuated tapping mode in fluid) Scanning Microscopy (SThM) Scanning Tunneling Microscopy () 声明:本网部分文章和图片来源于网络,发布的文章仅用于材料专业知识和市场资讯的交流与分享,不用于任何商业目的。任何个人或组织若对文章版权或其内容的真实性、准确性存有疑义,请第一时间联系我们,我们将及时进行处理。 |
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