牛津仪器MFP-3D Infinity™原子力显微镜

MFP-3D Infinity™原子力显微镜是MFP-3D 系列AFM的旗舰款,也是该系列中性能更为出色的产品。Infinity拥有丰富的成像模式和配件,还具有多功能性、以及一个可确保未来扩展的系统架构。MFP-3D Infinity能够让您的常规成像任务变得更简便、更快速,同时协助您完成更具挑战性的科研项目。

性能稳定的AFM,支持大尺寸样品

提供多种选择和丰富的模式,协助您将构思转化为结果

易于使用,又不降低灵活性

提供专业的售后支持和服务

MFP-3D Infinity™原子力显微镜特点和优势

性能稳定的,支持大尺寸样品

Superior mechanical stability—Noise floor is 33% lower than any other large-sample

Lowest-noise control electronics

Low noise, stability position sensors

Excellent acoustic vibration isolation

Robust construction, dependable performance that thrives in busy labs

提供多种选择和丰富的模式,协助您将构思转化为结果

Full suite of nanomechanical characterization modes available for measuring viscoelastic properties (storage/elastic modulus and loss modulus)

Unmatched range of nanoelectrical and electromechanical characterization modes

Numerous environmental accessories for control

Controlled gas or liquid environment options that are simple, safe, and effective

Unique accessories for applying external forces to a wide range of samples

易于使用,又不降低灵活性

ModeMaster™ automatically configures software for selected mode

GetReal™ automatically calibrates the cantilever spring constant and sensitivity

GetStarted™ automatically sets optimal parameters for tapping mode imaging

提供专业的售后支持和服务

Includes a two-year comprehensive warranty

No-charge technical support and expert applications support for life

Extended warranty and repair costs are the lowest in the industry

MFP-3D Infinity™原子力显微镜操作模式

支持的操作模式

Contact mode

DART PFM

Dual AC

Dual AC Resonance Tracking (DART)

Electrostatic Force Microscopy (EFM)

Force curves

Force Mapping Mode (force volume)

Force modulation

modulation

Kelvin Force Microscopy (KPFM)

Lateral Force Mode (LFM)

Loss tangent imaging

Force Microscopy ()

Nanolithography

Nanomanipulation

imaging

Piezoresponse Force Microscopy (PFM)

Switching PFM

Tapping mode (AC mode)

Tapping mode with digital Q control

Vector PFM

可选的操作模式

AM-FM Viscoelastic Mapping Mode

Contact Resonance Viscoelastic Mapping Mode

Fast Force Mapping Mode

Conductive (CAFM) with ORCA™ and Eclipse™ Mode

Current mapping with Fast Force Mapping

Electrochemical Strain Microscopy (ESM)

voltage PFM

Nanoscale Time Dependent Dielectric Breakdown (nanoTDDB)

Scanning Impedance Microscopy (sMIM)

Scanning Tunneling Microscopy ()