The Themis S S/TEM is an 80–200kV scanning / transmission electron microscope (S/TEM) designed for high-speed imaging and analysis of semiconductor devices. As the latest member of the industry-standard Themis family, the Themis S TEM inherits a unique co
JEM-ARM300F GRAND ARM 透射电子显微镜实现了世界最高扫描透射像(STEM-HAADF)分辨率,配备了JEOL自主研发的球差校正器,最高加速电压可达300kV,是一款原子级分辨率电子显微镜。实现了世界最高的STEM-HAADF像分辨率。实现了世界最高扫描透射像(STEM-HAADF)分辨率JEM-ARM300F配备了JEOL自主研发的球差校正器,最高加速电压可达30 ...